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ST
Instruments offers a complementary product range for surface analysis and nano
technology used in a wide range of applications for research and industry.
Our
proven AFM/SPM tools whose utmost quality and reliability are the essential
requirements for the applications of AFM/SPM users worldwide. The
XE-Series instruments are the most advanced AFM/SPM tools
for
non-contact metrology in data storage, semiconductors, nano science,
materials science,
polymers, and
electrochemistry.
The
trend-setting quality
and
reliability of
the XE-Series are proven also in life science applications, including
biological sample imaging, molecular interaction measurements, biological
system dynamics, manipulation and many others.
The
wide range of high performance optical profilers, interferometers, 3D-confocal
and stylus profilers offer solutions in the field of nano technology, life
sciences, material sciences, semiconductor and data storage, MEMS, optical
devices, polymers, paper and many others. |
