|
|
 |
InfiniteFocus |
|
The InfiniteFocus® is an
optical 3D measurement device for research and quality assurance in the micro-
and nano range. It provides all functionalities for 2D and 3D dimensional
measurements, surface analysis and characterization. Geometries with steep
flanks, different reflective properties and strong roughness are measured with a
vertical resolution up to 10 nm, making the instrument ideal for surface study
of both homogeneous and compound materials. 3D Measurements are performed
directly in the optical image. Its operating principle combines the depth of
focus of an optical system with vertical scanning to provide topographical and
color information from the variation of focus. Novel and unique algorithms
reconstruct this into a single 3D data set with accurate topographical
information. Traceable calibration standards allow the verification of
measurement results. The instrument can be used in both the laboratory and
on-line applications in production, it can be operated by semi skilled
technicians where required. Automation of functions and analysis can be added to
make the instrument useable for the majority of surface metrology and inspection
requirements. |
|
|
| |
Product datasheet
InfiniteFocus |
 |
|
|
 |
Plμ4300 |
|
The Sensofar’s PLμ
4300 is an optical profiler for the 3D measurement of surfaces and thin films.
The unique combination of Interferometrical optical profiling and Spectroscopic
Reflectometry on the same sensorhead makes the PLμ 4300 the only system in the
market able to measure 3D profiles, roughness and thickness of opaque and
transparent materials with sub-nanometer resolution. The optically integrated
Spectroscopic Reflectometer opens an unprecedented combination of an optical
profiler and thin film measurement technology on a single instrument. In real
world, White Light interferometry is limited to measure thicknesses thicker than
500 nm. In contrast, Spectroscopic Reflectometer is able to measure thicknesses
from 10 nm with 0.1 nm of resolution in a tenth of a second. |
|
|
| |
Product datasheet
Plµ4300 |
 |
|
|
 |
Plμ2300 |
|
The
PLµ2300 Optical Imaging Profiler is a unique Dual Technology sensor for
profiling, combining Confocal and Interferometry techniques. A selection can be
made between standard microscope imaging, confocal imaging, confocal profiling,
PSI and VSI on a single instrument. The optical imaging profiler is a complete
and perfect tool for obtaining a fast non-invasive assessment of the micro - and
nano geometry of technical surfaces. It's suitable for multiple configurations:
from the stand set-up for R&D and quality inspection laboratories, to the
manipulator or robot-driven system for on-line process controls. The PLµ 2300
optical imaging profiler, offers a unique wide spectrum of applications with
high contrast algorithms and an extremely high light efficiency for measuring
steep slopes, rough and low reflective surfaces, dissimilar materials and very
smooth surfaces (optically polished). |
|
|
| |
Product datasheet
Plµ2300 |
 |
|
|
 |
Plμ1300 |
|
The
PLµ 1300 is a portable Optical Imaging Profiler capable of measuring 3D
information of technical surfaces with the use of Interferometric and Confocal
technologies. The sensor has been designed to have all optical components sealed
in order to operate in production environments, where dust and particles are all
over. With a total weight less than 4.5 kg and up to 5 meter long single cable,
the operator handles the sensor safely and places it onto the surface under
inspection. By a single start/stop button the surface topography is measured,
analysed and reported. By default PLµ 1300 comes with interferential technology
which is able to achieve the highest axial resolution (down to 0.1 nm in PSI
mode), and up to 400 µm scanning range for VSI. Extended PSI keeps the PSI
resolution with increased vertical scanning range. Confocal technology can be
added optionally to measure higher local slopes and rough surfaces.
|
|
|
| |
Product datasheet
PLµ1300 |
 |
|
|
 |
DHM 1000 series |
|
For the first time in microscopy, real time, non-invasive 3D measurements with
nanometric resolution can be measured with a
revolutionary technology called "Digital Holographic Microscopy" (DHM™). The
characteristics of DHM™ instruments make out of it a unique solution for
following the whole development cycle of a product, from innovative R&D to
quality control in production line, passing through the quantitative
optimization of the manufacturing process. |
|
|
| |
Product datasheet DHM
1000 |
 |
|
|
 |
HP series |
|
The HP series are built to
advanced specifications in order to provide consistent, repeatable results and a
high or ultra-high level of precision. Designed for the measurement and analysis
of micro and nano-geometry and 2D/3D surface texture, they are the most flexible
systems on the market, offering unparalleled upgradeability. The NJ HP series
can be equipped with Mono-gauge (contact or non-contact) and dual-gauge (contact
and non-contact) configurations are available. The x axis and the y axis (on 3D
systems) are 100 mm. The z axis is 50 mm. The NJ-HP series is completed by a 3D
systems with up to four gauges, a measurement envelope of 200 mm x 200 mm x 200
mm. |
|
|
| |
Product datasheet NJ
HP series |
 |
| |
| |