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| Scanning Probe Microscopy is
the primary tool in nano scale metrology and analysis. SPM provides not only
topographic images with quantitative data, but also measures various mechanical
and electrical properties of samples with unprecedented sensitivity and spatial
resolution. |
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| ST
Instruments offers a
wide range of Scanning Probe Microscopes. The Park Systems XE series SPM is the result of intensive development, producing a significant evolution in commercial SPM. The XE-series
is built by the original pioneers in SPM technology with 20 years of experience
in the field. The Nanosurf SPM series is recognized for there ease of use and
modularity which makes it an essential tool for
teaching, training, and research in nanotechnology.
Nanosurf is a spin-off company of the University
of Basel, one of the most important SPM centres of competence in the world.
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| The
Scanning Probe Microscope can be used in a wide range of applications such as: |
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