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Last update 16-08-2007
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Scanning Probe Microscopes can image the surface of a sample by measuring the interaction between the atoms on the sample surface and an extremely sharp probe tip, which is produced by micro machining. SPM can magnify the surface over 10 million times, making it possible to image individual atoms. SPM can be operated in air as well as in a vacuum, while electron microscope can be operated only in vacuum.
Not only can SPM image the topography of the sample surface, but also can measure its electrical, magnetic and physical properties. For its unprecedented high resolution and versatility, SPM has made a profound contribution in many areas of research, including materials science, surface analysis, polymers, nanotechnology and biology.
By clicking on the icon a description of the technique is given.
contact AFM non-contact AFM dynamic contact AFM
   

 

Contact AFM
Non-contact AFM
Dynamic contact AFM
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