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XE-70 |
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The XE-70 is the newest addition to its
award winning "Cross-talk Elimination" (XE) series of AFM/SPMs. Like its more
expensive siblings, XE-70 features decoupled XY and Z scanners to essentially
eliminate intrinsic bowing that exists with other tube-scanner-based Atomic
Force Microscopes. With True Non-Contact mode imaging, 1-micron resolution
on-axis optical viewing, flexible sample handling (accommodating samples up to
100mm in diameter and 20mm in thickness and weighing up to 500 grams), and other
innovative technologies of XE-100, the XE-70 provides the winning combination of
affordability and advanced SPM technology to the researchers. |
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Brochure XE-70 |
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XE-100 |
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The XE-100 is the first product in the award winning "Cross-talk
Elimination" (XE) series of AFM/SPMs, provides the most accurate way to scan
your samples with ultimate AFM resolution and reliability via non-contact AFM.
The XE Series represents breakthroughs in every aspect of AFM technology -
advanced scan system, on-axis optical viewing with the highest optical
resolution (1 micron), flexible sample handling (accommodating samples up to
100mm in diameter and 20mm in thickness and weighing up to 500 grams), and True
Non-Contact imaging. XE-series AFMs achieve the ultimate resolution of AFM since
the sharp end of a tip is preserved in True Non-Contact imaging mode unlike in
contact or intermittent (also known as tapping) imaging modes. With motorized
focus for on-axis optics, XE-100 provides added versatility to the operation of
AFM within the acoustic enclosure. |
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Brochure XE-100 |
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XE-BIO |
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The XE-Bio is a fully functional, liquid
Atomic Force Microscope designed specifically for the biomedical and life
science markets. The modular design of the XE-Bio provides the user with a wide
array of imaging modes including the revolutionary scanning Ion Conductance
Microscopy (ICM) module. The ICM module is specifically designed for non-contact
in-liquid imaging where the nanopipette probe senses ion current to feedback its
position for samples completely immersed in a liquid buffer. Ideal for imaging
soft biological samples, such as living cells, ICM can easily be adapted to a
host of qualitative and quantitative imaging applications including, but not
limited to, electro-physiology, surface topography and cell motility studies. |
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Brochure XE-BIO |
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XE-150 |
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With the arrival of the XE-150, Park System's large sample AFM,
non-contact AFM imaging has become the most feasible and practical way to scan
your large samples with the ultimate AFM resolution and reliability. The XY
motorized sample stage is optimized for large sample (150 x 150 x 20 mm)
placement and allows full travel of the entire sample (optional accessories can
accommodate up to 200 x 200 mm samples). Together with its own acoustic
enclosure and advanced active vibration isolation system, the XE-150 guarantees
the ultimate low noise performance. As the key feature of the XE-Series, true
non-contact mode achieves an unprecedented tip-sample distance, combined with
superb tip and sample preservation. The direct on-axis optics is the first in
the industry that revolutionizes the way AFM users view their samples by
providing the natural on-axis view from the top with unprecedented clarity and
resolution. |
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Brochure XE-150 |
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XE-200 |
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The XE-200 is
an AFM with increased capacity that supports 200 mm wafer investigation. In
addition to the precise scan performance provided by True Non-Contact mode, the
XE-200 offers users an encoded XY stage that travels over the entire 200 mm x
200 mm sample area, an enlarged XY scan range of 200 μm x 200 μm, and a Z scan
range of 25 μm. Also, the industrial-grade automation features of the instrument
greatly minimize the user‘s required participation during system operation |
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Product datasheet XE-200 |
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XE-NSOM |
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XE-NSOM is specially designed and tailored for advanced optical
measurements including Near Field Scanning Optical Microscopy (NSOM), Raman
Spectroscopy and Confocal Microscopy. XE-NSOM provides a complete AFM system
setup with unsurpassed versatility for these optical experiments. The
high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM
and utilizes cantilever-based closed-loop feedback technology. |
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Brochure XE-NSOM |
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easyScan 2 |
Starting small doesn’t mean
buying a new system each time your needs change. With the new easyScan 2 series
you can just add the additional parts to your existing easyScan 2 system,
building and expanding your possibilities as you go. A basic STM experiment can
quickly lead to a desire for more, which in turn generates needs that outgrow
your existing system. The easyScan 2 series offers you the flexibility to
purchase a quality instrument at an affordable price and then to expand and
customise as and when you need to.
The easyScan 2 is designed with a simple building block structure that doesn’t
take up your whole work space. The controller electronics and power adapter are
all contained in one box. Modular inserts extend the controller's abilities and
can take you from atomic resolution on graphite to MFM and lithography. Various
scan heads and software modules add to the flexibility of the easyScan 2 system
and a Micrometre Translation stage or a Signal Module further expand its
possibilities. |
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Brochure easyScan 2 |
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Mobile S |
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The Mobile S Cordless Edition is a truly
mobile AFM that boasts a rechargeable battery that can power it for up to five
hours, while tipping the scales at a very transportable 4.7 kg. Instead of being
tied down by mains cables and bulky controllers, all you need now is a laptop,
and the world is your lab. This additional freedom is perfect for laboratories
sharing an AFM or for experts performing measurements in the field, where simple
transport and minimal setup time are of the essence. |
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Brochure Mobile S |
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Nanite |
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The Nanite is composed of a
mountable AFM and an automated X/Y/Z stage. Its
scripting capability and motorized X/Y/Z stage make it possible for users to
prepare a series of routine measurements and leave the microscope to measure on
its own, focusing their skills on more challenging tasks.
Whether your process quality control requires measurements at random points of a
large surface or on multiple samples in a reproducible location, the Nanite can
do it. Fast and reproducible cantilever exchange and the precise re-positioning
of the scan head ensure that your batch program performs the same measurement it
did six months ago. |
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Brochure Nanite |
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easyPLL plus |
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Sharper images for cutting edge
research. Enhance your non-contact AFM's performance with the easyPLL plus
system. All the time-tested functions of the easyPLL: Excellent frequency
resolution and wide bandwidth, digitally generated frequency - low temperature
drift. Frequency shift, dissipation, phase amplitude measurements. Plus: Digital
phase shift for the reference signal, larger frequency lock range, full spectrum
analysis of sensor as amplitude and phase plot. Lower frequency noise,
adjustable output filters improve S/N ratio for slow movements. UHV-compatible
tuning fork preamplifier available. |
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Brochure easyPLL |
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