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Last update 17-05-2008
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 Optical profilers
 Stylus profilers
 Thin film metrology
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Stylus profilometry is a common tool for 2D-characterization of surfaces. Nowadays its  even possible to measure and analyze 3D surfaces, with the advantages of high resolution data without the disadvantages of optical interference. ST Instruments offers different stylus solutions depending on the application including combination with optical profilometry .  

Stylus profilometry can be used in a wide range of applications such as:

  • Semiconductors & data storage

  • Nanotechnology

  • Material science

 

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