24 jan Webinar: An Evolution in Sample Preparation by the Application of Broad Ion Milling
Krefeld | January 25, 2018
On Thursday, January 25th, 2018 (8.00PM-9.00PM CET), Hitachi High-Technologies will be hosting a webinar titled “An Evolution in Sample Preparation by the Application of Broad Ion Milling”, presented by Jamil J. Clarke. Multiple methods exist when it comes to sample preparation for analysis in the scanning electron microscope (SEM). It is a common fact that mechanical polishing techniques often smear, delaminate and induce artifacts that pose a challenge to determine if the material observed is true to form or not. The role of material preparation has changed in recent years with the advent of broad ion beam milling (BIB) systems designed to process material and yield practically damage free results.
Registration is required.
How and why sample preparation is important
Broad ion beam concepts and principles
Hitachi’s latest BIB technology portfolio including the world’s first sample preparation system with 1000 µm/hr sputter rate
Case studies of how workflow solutions are executed for preparing and analyzing a variety of specimens