<%@ Language=VBScript %> Home
All contents copyright © ST Instruments B.V. 2006
Last update 07-07-2010
Webshop Support Home About Contact us

Links

 SPM / AFM
 Optical profilers
 Thin film metrology
 Mechanical testing
 Surface analysis
 Vibration isolation
 Analyse software
 
ST Instruments offers leading 3D reconstruction, visualization and analysis software. This provide solutions in R&D as well as in production for materials development, live sciences, pharmacy, forensic applications and numberless others.
The MeX software opens the possibility to use your existing Scanning electron microscope as a 3D measurement tool. 

 

MeX
Back