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MeX
is a stand alone software package that turns any SEM with digital imaging
into a true surface metrology device. Using stereoscopic images the software
automatically retrieves 3D information and presents a highly accurate,
robust and dense 3D dataset which is then used to perform traceable
metrology examination. The results are obtained irrespective of the SEM
magnification providing metrology at macro and micro levels... |
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Makes 3D
measurements directly from SEM images
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Modular
software for profile-, roughness-, area- and even volume analysis
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Fast,
robust and accurate analysis is combined with very easy operation
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No
additional hardware is necessary
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Runs on
standard PCs with any common operating system
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Extensive
export and printing capabilities
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The software is self installing and is extremely easy to
use. The modular design of the package allows flexibility in use; it also
permits users, with a single repetitive task to perform, to purchase
modules according to requirements. The analysis modules allow measurement
of profile, roughness, area, volume and ìZî height. All measurements are
traceable, can be calibrated and conform to ISO standards.
The performance of MeX has been proved by many customers in
leading companies and universities throughout the world providing imaging
and analysis previously unobtainable with SEM images. |