TEX is an innovative software solution allowing the capturing of images from an optical microscope. 2D feature and dimensional analysis including advanced automatic measurement refinement is also provided in all modules. Basic 3D viewing and profile analysis even over larger areas are available in advanced packages.
Real time capturing of full depth of focus images is a feature of all versions of TEX. Full depth of focus images can be viewed and saved.This uniquely removes the limitations of conventional products caused by the small depth of focus with normal microscope objectives.

• Re eal-timcapturing of full depth of focus images

• 2D image analysis including automatic measurement capabilities

• Easy to use, easy to install

• Graphical database system

• Advanced viewing capabilities

• Basic 3D visualization including height measurement in advanced packages

• Capturing and viewing of complicated specimen as a full depth of focus image

• Quality assurance in all areas of manufacture and control

• Nanoscience and biological applications where a full depth of focus image will enhance the result

• Measurements of dimensions on critical parts

• Measurements of critical part dimensions
• Capturing of complicated specimen
• Quality control
• Nano science