30 mei Hitachi High-Technologies launches the most advanced Ion-Milling System: ArBlade 5000
Krefeld | May 30, 2017
Hitachi High-Technologies announced that it launched sales of the latest evolution, the Hitachi ArBlade 5000 broad ion-milling system. This product enables high throughput and prepares wide-area cross-sectional samples.
The ArBlade 5000 is a state-of-the-art ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. The ArBlade 5000 is supplied with a fast-milling Ar ion gun with a milling rate twice as high for cutting-edge performance, which dramatically reduces processing time for cross-section preparation. With cross-section widths up to 8 mm, this brand-new ion-milling system is suitable for the most complex application needs.
Ion-milling systems polish the surface of samples using the sputtering effect caused by the irradiation of an argon ion beam onto the surface. Sample-preprocessing systems are used in research and development, quality control, and related activities in various fields such as electronics and advanced materials.
Unlike mechanical polishing, ion-milling systems process samples without deforming or applying mechanical stress. As a result, ion-milling systems used to preprocess samples have found an expanded scope of application, including not only Electron Microscopy, but also Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM) and others. Users in a variety of fields have provided critical suggestions and improvements to be made in the throughput of these systems which are now incorporated into the latest design platform.