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				All contents copyright © ST Instruments B.V. 2006
				Last update 17-05-2008

SPM / AFM

Optical profilers

Stylus profilers

Thin film metrology

Mechanical testing

Surface analysis

Analyse software

NEWS

19-5-2008

Sensofar launches the PLµ 4300 The PLµ 4300 is an optical profiler and a high resolution Spectroscopic Reflectometry thin film metrology system in one system.

05-2-2008

The new Table Top Nanoindentation Tester (TTX) combines all the advantages of the standard Nanoindentation Tester into a small and simple-to-use instrument whichis ideally suited to routine testing.

ABOUT

ST Instruments is your local distributor to provide innovated technologies used in material science, life science and nanotechnology. ST Instruments operates in the Benelux and Nordic countries.

18-4-2007

CSM Instruments launched a complete Xpress line of instruments designed for Adhesion as well as Hardness and Elastic modulus of Thin films.