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 SPM / AFM
 Optical profilers
 Stylus profilers
 Thin film metrology
 Mechanical testing
 Surface analysis
 Analyse software
 
To offer leading edge technology ST Instruments partners with the following manufactures:
   
Park Systems, Scanning Probe Microscopy
   
Nanosurf, Scanning Probe Microscopy

 

 
CSM Instruments, Material Properties Characterization
   
Physical Electronics, Surface Science Instruments
   

Sensorfar, optical metrology based on confocal and interferometry

   

Lyncée Tec, high resolution optical metrology based on DHM technology. Used in life- and  material science applications.

 

 
Alicona Imaging, 3D reconstruction, visualization and analysis soft- and hardware.

 

 
nanoJura 3D non-contact surface measurement based on laser and optical inspection technologies.
   

Applied Nanostructures, High resolution SPM probes

   
Filmetrics, affordable and easy-to-use instruments for measuring film thickness.

 

 
Table Stable, active vibration isolation solutions