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Thin Film Metrology

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Vibration Isolation

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Laser Raman Microscopy

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Scanning Probe Microscopy

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Analyse Software

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Mechanical Testing

Non-contact surface metrology

Non-contact surface metrology

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Surface Analysis

News

Park Systems Unveils NX10

Park Systems Unveils NX10

Placed at 01-01-2012 13:50:00 by admin

Park Systems has introduced the NX10, the world’s most accurate AFM, as the flagship AFM of its new product line. Now available worldwide, the NX10 brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price.