SPM / AFM  » 

Scanning Probe Microscopy is the primary tool in nano scale metrology and analysis. SPM provides not only topographic images with quantitative data, but also measures various mechanical and electrical properties of samples with unprecedented sensitivity and spatial resolution.

The Scanning Probe Microscope can be used in a wide range of applications such as:

* Semiconductors & data storage
* Nanotechnology
* Biotechnology & life sciences
* Polymers
* Material science

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