Thin film metrology  » 

ST Instruments offers Imaging Ellipsometry, which combines the power of ellipsometry with microscopy and affordable and easy-to-use Spectral Reflectance instruments for measuring film thickness in the range from 30Å to 450µm, index of refraction and deposition rates.

The various instruments can be used in a wide range of applications such as:  

* Optical coatings
* Optoelectronics
* Life Sciences
* Hard coats
* Displays
* Semiconductors and MEMS

Go back to top