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Last update 02-08-2007
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ST Instrument offers a large selection of conventional SPM Probes for all kind of applications. All Applied NanoStructures probes are designed to fit in all AFMs. The probes are made out of heavily doped single crystal silicon and the tip is pyramidal in shape. Find your probe by selecting the right model. Please feel free to contact us if you have more specialized requirements.

Contact Probes

 

AC mode Non-contact / TappingTM Probes

 

 

Force modulation Probes
Electrical Probes
Magnetic Probes

High Aspect Ratio Probes – No Tilt Compensation

 

 

High Aspect Ratio Probes – 3º Tilt Compensation
High Aspect Ratio Probes – 12º Tilt Compensation
Customized Probes

Probes overview
Price request

 

 
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