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ST
Instruments offers with Physical Electronics (PHI) the worlds leading
supplier of surface analysis instrumentation. For over thirty years PHI
has designed, manufactured, and supported innovative surface analysis
instrumentation. The products are built around core technologies that
address the specific and ever changing needs of a wide range of advanced
materials applications. The instruments are designed to be robust, provide
unique capabilities, and enhance productivity. Supported by experienced
scientists dedicated to the proactive pursuit of key market innovations,
ensuring that you stay ahead of the curve.
Researchers and manufacturers of a broad range of products from
microelectronics to food wrap rely on PHI instruments to develop new
materials, new manufacturing processes, solve problems, and increase product
yield. |
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What is Surface
analysis |
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The objective
of a surface analysis experiment is to determine the chemical composition of
the outer few atomic layers of a solid surface. This is accomplished by
using a probe beam to stimulate the emission of electrons, atomic or
molecular ions from a surface. Surface analysis instruments analyze the
emitted charged particles and provide elemental, chemical state or molecular
structure information. Because surface analysis experiments are typically
performed in an ultra high vacuum (UHV) environment, surface analysis
techniques are generally applied to solid surfaces. Both organic and
inorganic materials may be analyzed, depending on the technique.
The average
analysis depth of these surface analysis techniques is approximately 5-50 Å,
with the exact analysis depth dependent on the specific technique. As a
result, surface analysis techniques provide unique information that cannot
be obtained with instruments having a larger analysis depth, such as energy
dispersive x-ray analysis (SEM-EDX) and Fourier transform infrared analysis
(FTIR). To probe below the surface, surface analysis instruments are
equipped with a sputter ion gun to allow the controlled removal of material
from the sample surface. This allows the thickness of surface layers to be
measured and multi-layer thin film structures to be characterized.
When a
surface analysis instrument is equipped with a small diameter probe it
provides a unique capability that facilitates spectral analysis and imaging
of extremely small sample features, defects or particles. |
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Why is Surface analysis important |
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The composition of
the outer most atomic layers of a material plays a critical role in properties
such as: chemical activity, adhesion, wettability, electrostatic behavior,
corrosion resistance, bio-compatibility, etc. In addition, contaminants,
process residues, diffusion products, and impurities are typically present at
the surface of a solid sample.
The ability to
analyze thin film structures, via sputter depth profiling, provides the unique
opportunity to characterize materials used in thin layers and to study their
interaction with materials in adjacent layers. Surface analysis instruments are
often used to guide the development of deposition processes and to validate a
process when new deposition equipment is installed.
The ability to
analyze sub-micron defects or particulate contaminants is of critical importance
to increasing product yield in a number industrial applications including:
semiconductor device fabrication, hard disk read/write head fabrication,
specialty mirrors, composite materials, etc. |
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