To determine film thickness and refractive index of polymers, semiconductors, thin film metals and many more. This widespread use is explained by increased dependence on thin films in many areas and the flexibility to measure most material types.
♦ Single-Spot Measurements / Tabletop systems for measuring film thickness and refractive index
♦ Microscopic-Spot Measurements / Used when a measurement spot as small as 1µm is required
♦ Automated Mapping Systems / Fully-automatic mapping of thickness and index for nearly any sample shape
♦ Inline Monitoring / Monitor and control thickness of moving films during production