Thickness-Measurements-

Thickness Measurements

To determine film thickness and refractive index of polymers, semiconductors, thin film metals and many more. This widespread use is explained by increased dependence on thin films in many areas and the flexibility to measure most material types.

Spectral Reflectance

LAYER THICKNESS, REFRACTIVE INDEX

F20-series♦   Single-Spot Measurements / Tabletop systems for measuring film thickness and refractive index

   Microscopic-Spot Measurements / Used when a measurement spot as small as 1µm is required

♦   Automated Mapping Systems / Fully-automatic mapping of thickness and index for nearly any sample shape

♦   Inline Monitoring / Monitor and control thickness of moving films during production

Imaging Ellipsometry

LAYER THICKNESS

EP4SW♦  Brewster Angle Microscope / Imaging technique for the investigation of ultra-thin films

♦  Imaging Ellipsometer / Measuring and imaging film thickness and optical properties

♦  Referenced Spectroscopic Ellipsometer / For analyzing films, layers and surfaces

Calotest

THICKNESS OF NON-TRANSPARENT MATERIALS

Calotest

♦   Calotest / Simple ball-cratering method for fast and accurate measurement of any coating thickness

♦   Industrial Calotest / Calotest with hydrolic arm, allowing users to target samples of unlimited size