To understand the art of thin-film thickness measurements an easy guide can be downloaded. The goal in creating this guide is to enable our customers to better understand the physics of spectral reflectance. This twelve-page guide entitled “Taking the Mystery Out of Thin-Film Measurement” is ideal for everyone involved with the thin-film industry. Whether your job is depositing, measuring, or using thin films , understanding the principles behind spectral reflectance will be a valuable addition to your knowledge base.
After a short introduction to thin-film technology, the guide breaks down the complexities of spectral reflectance for both single and multiple layer film stacks, as well the interactions of thickness measurements with optical constants. The last section compares spectral reflectance to ellipsometry.
 

To request a copy of “Taking the Mystery Out of Thin-Film Measurement” so that you too can understand the physics of spectral reflectance.