General-Purpose Thin-Film Measurement Instruments. The world's best-selling tabletop measurement system. Available with a wide range of accessories and thickness coverage.

Application-Specific Thin-Film Measurement Instruments. F10-AR measures reflectance of ophthalmic lenses and other curved surfaces. Options available for transmittance and hardcoat thickness measurement. F10-HC measures hardcoat and anti-fog film thickness and index. Popular in automotive and other industries that hardcoat polycarbonate. F10-PA provides hands-free parylene thickness measurement. F10-VC measures reflectance and transmittance simultaneously. Options available for thickness and index measurement. Popular in vacuum coating applications.

On-Line Thickness Measurement Systems. F30 monitors reflectance, thickness, and deposition rates during MOCVD, sputtering, and other deposition processes. F37 is an in-line film thickness measurement instrument with up to seven probe locations supported.

Turns Your Microscope into a Thin-Film Thickness Measuring Tool. Spectral analysis of reflections from the top and bottom of the thin film provides thickness in seconds. For measurements on patterned surfaces and other applications that require a spot size as small as 10 microns, just add the model F40 to your microscope. For common microscopes the F40 is a simple bolt-on attachment, complete with a c-mount for a CCD camera.

Automated Thickness Mapping of Unpatterned Surfaces. F50 adds automated mapping capabilities to our F20 family of products. Map Thickness and index as fast as two points per second. F50-XY-450 used for mapping samples larger than 300mm in diameter. F60 production-ready tabletop thickness mapping system includes on-board reference, notch finding, interlocked cover, and more.