Modern technologies in the field of high resolution measurement and high precision manufacturing have an increasing demand on effective vibration isolation solutions. Stopping the influence of disturbing ambient vibrations using common passive damping approaches often requires immense physical and financial efforts.

The active vibration isolation systems allow ultimate performance from a wide range of high resolution measurement techniques and instrumentation such as:

• Scanning Probe Microscopy

• Scanning Electron Microscopy

• Scanning Near-Field Optical Microscopy 

• Confocal Laser Scanning Microscopy

• Interferometry

• Nano Indentation and Lithography

• Metrology / Profilometry