16 mrt Webinar: Scanning X-ray Imaging

Chicago | March 29, 2018

On the 29th of March, our partner Physical Electronics organizes a live webinar about the benefits and capabilities of Scanning X-ray Imaging (SXI). Dr. Ben Schmidt, XPS Scientist at Physical Electronics, will host the event. The webinar starts at 3PM (CET). Registration is required.

Why using Scanning X-ray Imaging?
SXI imaging is a fundamental feature of PHI XPS scanning microprobe systems. As the X-ray beam is scanned across a sample, secondary electrons are collected and imaged through the same spectrometer used for XPS analysis, giving the user SEM-like navigational capabilities to locate areas of interest with complete confidence. In this webinar, you will learn more about the benefits of SXI and how it can aid your XPS analysis.