2nd edition of FAMT Symposium on Failure Analysis and Material Testing – FAMT 2022


Groot-Ammers | July, 2022

Fraunhofer IMWS and Park Systems will organise the International SPM Symposium on Failure Analysis and Material Testing – FAMT 2022 on                                      Thursday, July 22nd, 2022


The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.


Keynote speakers:

Dr. Dongchul Ihm – Samsung Semiconductor (R&D Center, South Korea)

Nicholas Antoniou – PrimeNano, United States

Dr. Jürgen Leib – Fraunhofer IISB, Germany

Alexander Klasen – Park Systems Europe, Germany

Dr. Albert Minj – IMEC, Belgium

Prof. Silke Christiansen – Fraunhofer IKTS, Germany

Derek Nowak, Ph.D. – Molecular Vista, USA

Nicholas Randall. – Alemnis AG, Switzerland


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