MATERIALS SCIENCE

Combining STEM and PiFM for Complementary Nanoscale Sample Analysis

Performance Evaluation of Lubricants with Mini Traction Testing

Analyzing tools of the first Neolithic early farmers

Measurement of -OH termination on hydrophilic surfaces

Semiconductor manufacturing

End-to-end metrology strategies for QC in the semiconductor industry

Analyzing sub-20 nm defects and ultrathin residues in semiconductor processes

Submicron, simultaneous and non-contact IR+Raman spectroscopy for direct fiber characterization

Surface Sensitivity of PiFM

The ultimate guide to surface texture characterization

Cross-sectional IR PiFM Analysis

PiF-IR vs FTIR: How Useful is Nano‑spectroscopy?

Separation and Quantitative Analysis of Carbon and Carbonates in Surface Material of Asteroids

Surfaces Analysis Spotlight – Complementary XPS and TOF-SIMS

Automated image acquisition of cathode active material particles in lithium-ion batteries

Measuring Super Smooth Surfaces

Exploiting the potentialof 3D optical profilometry

STEM observation of Kaolin

PCB characterization

Enhancing PCB quality control with Sensofar’s 3D Metrology Solutions

Multi-perspective characterization of an end mill

Particle Size Analysis of Carbon Nanotube with Porosity Correction

Multimodal spectroscopy techniques for nanostructured materials characterization

The evaluation of texture geometries of automotive engine cylinder liners produced by femtosecond pulsed laser processing

AFM-IR-Raman: Using three techniques for better nano-chemical analysis

Graphene studies using Raman spectroscopy

The use of ochre 40,000 years ago in Africa

Voltage contrast imaging of nanotube filler in rubber

Soft plasma etching for Graphene and 2D Materials

Polymorphisms characterization: when Raman microscopy supports the pharmaceutical industry

Foundry & Weldings – Material inspection of foundry components

Characterizing process-induced form and surface texture change in additive manufacturing

Cutting edge measurement of an insert

Injection Molding – Aventics Pneumatic Solutions

Spatial Resolution of PiFM

Characterization of surfaces that Generate Structural Color by Total Internal Reflection

Characterizing the temperature-induced evolution of the shape and texture of a silicon wafer

Case Study | Composites Materials and Fibers

Characterization of micro-channels

fabricated with laser for microfluidic applications

New Material Observation Method by SEM

using Ultra Variable-pressure Detecotr (UVD)

Case Study | 3D Printing – Additive Manufacturing

Non-destructive characterization of membrane photonic crystal devices

using a S neox

Scratch resistance of chemically strengthened glass

using Universal Scratch Tester (UST-2)

Measurements for femtosecond laser micro-milling and functional texturing 

using a Sneox Five Axis

Reducing friction for efficient motion of sliding surfaces

by Laser Surface Texturing

Geometric measurement of the ceramic layers

made by the robocasting technique

In-situ SEM observation of a tensile fracture process

Using the SU7000

Characterizing grease and oil by Block-on-Ring Test

Using the MFT5000

Tapping Torque Tester

Evaluation of metal working fluid and lubricant formulations

Low Friction Measurements

with Nano Tribometer Module

Reducing friction and wear loss of materials by lubrication technologies 

4-Ball Wear Tester

High Temperature Hardness Testing on alloys

using MFT5000

Electrical Conductivity Measurement of Carbon Nanotubes Film

Conductive Probe Atomic Force Microscopy

2D materials morphology and electrical property testing 

using high vacuum conducting SPM

Three-dimensional EDX Mapping of an Alloy Fracture Surface

using SU5000

Cross-section milling of dental casting gold-silver-palladium-copper alloys

using ArBlade5000

The tribological study of a surface of an archaeological drawing

using a S-NEOX Optical Profiler

Segregation of impurities in ductile iron

Scanning Auger spectroscopy combined with in-situ facture analysis

Hexagonal boron nitride optical nano dipole antennae

Photo Physics

Overcome charge-up effects in SEMs

during non-conductive specimen observation with Hitachi’s UVD

Linear Sliding Tribometer 

with Inline 3D Imaging

In-situ metrology for pad surface monitoring in CMP

using a S mart