The Quantera II is a XPS scanning microprobe designed to achieve high-throughput in large area and micro-area spectroscopy, imaging, and depth profiling. The stand-out feature of this fully automated system is its scanning X-ray source. The Quantera II is easy to use and produces repeatable and consistent measurements.
♦ Micro-focused scanning X-ray source
♦ Micro area spectroscopy
♦ High throughput automated analysis
♦ Identifying stains on packaging materials
♦ Automated QC analysis silicone detection
♦ Determining solder balls surface chemistry
Since 1969, Physical Electronics (PHI) has been providing UHV surface analysis instrumentation, which is used for research and development of advanced materials. What started with a sole focus on Auger surface analysis instruments, later expanded to technologies like XPS and TOF-SIMS to address a growing range of applications.
♦ Unique tools
♦ Helps enabling next generation technologies
♦ More than decades of experience