Quantera II XPS Scanning Microprobe
The Quantera II is a XPS scanning microprobe designed to achieve high-throughput in large area and micro-area spectroscopy, imaging, and depth profiling. The stand-out feature of this fully automated system is its scanning X-ray source. The Quantera II is easy to use and produces repeatable and consistent measurements.
Key Features and Benefits
♦ Micro-focused scanning X-ray source
♦ Micro area spectroscopy
♦ High throughput automated analysis
Applications
♦ Identifying stains on packaging materials
♦ Automated QC analysis silicone detection
♦ Determining solder balls surface chemistry
About Physical Electronics
Since 1969, Physical Electronics (PHI) has been providing UHV surface analysis instrumentation, which is used for research and development of advanced materials. What started with a sole focus on Auger surface analysis instruments, later expanded to technologies like XPS and TOF-SIMS to address a growing range of applications.
Why Physical Electronics?
♦ Unique tools
♦ Helps enabling next generation technologies
♦ More than decades of experience
Related products
Wafer Fab AFM with automatic defect review
Fully-automatic mapping of thickness and index for nearly any sample shape
Versaprobe III XPS Scanning Microprobe
Multi-technique XPS including PHI’s patented X-ray beam induced secondary electron imaging