Quantera II XPS Scanning Microprobe

The Quantera II is a XPS scanning microprobe designed to achieve high-throughput in large area and micro-area spectroscopy, imaging, and depth profiling. The stand-out feature of this fully automated system is its scanning X-ray source. The Quantera II is easy to use and produces repeatable and consistent measurements.

Quantera II XPS Scanning Microprobe

ICON-key-features-greyKey Features and Benefits

♦   Micro-focused scanning X-ray source

♦   Micro area spectroscopy

♦   High throughput automated analysis


♦   Identifying stains on packaging materials

♦   Automated QC analysis silicone detection

♦   Determining solder balls surface chemistry

About Physical Electronics

Since 1969, Physical Electronics (PHI) has been providing UHV surface analysis instrumentation, which is used for research and development of advanced materials. What started with a sole focus on Auger surface analysis instruments, later expanded to technologies like XPS and TOF-SIMS to address a growing range of applications.

Why Physical Electronics?

♦   Unique tools

♦   Helps enabling next generation technologies

♦   More than decades of experience

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