Materials Science
High quality materials research investigates the relationships between the synthesis, processing, structure, properties, and performance of materials that enable an engineering function. It involves relating the desired properties and performance of a specific material in a certain application to the structure of the atoms and phases in that material through characterization. At ST Instruments we provide a complementary range of surface measurement equipment to accelerate your research in this field.
In-situ metrology for pad surface monitoring in CMP
using a S mart
Ultramicrotomy of Silicate Catalysts Powders
using a PowerTome PCZ
Scratch resistance of chemically strengthened glass
using Universal Scratch Tester (UST-2)
Measurements for femtosecond laser micro-milling and functional texturing
using a Sneox Five Axis
Reducing friction for efficient motion of sliding surfaces
by Laser Surface Texturing
Geometric measurement of the ceramic layers
made by the robocasting technique
In-situ SEM observation of a tensile fracture process
Using the SU7000
Characterizing grease and oil by Block-on-Ring Test
Using the MFT5000
Tapping Torque Tester
Evaluation of metal working fluid and lubricant formulations
Low Friction Measurements
with Nano Tribometer Module
Reducing friction and wear loss of materials by lubrication technologies
4-Ball Wear Tester
High Temperature Hardness Testing on alloys
using MFT5000
Electrical Conductivity Measurement of Carbon Nanotubes Film
Conductive Probe Atomic Force Microscopy
2D materials morphology and electrical property testing
using high vacuum conducting SPM
The tribological study of a surface of an archaeological drawing
The tribological study of a surface of an archaeological drawingusing a S-NEOX Optical Profiler
Optimum Current Distribution Measurement of Zinc Oxide Nanorods
Materials Science: PinPoint™ Conductive AFM
Segregation of impurities in ductile iron
Scanning Auger spectroscopy combined with in-situ facture analysis
Hexagonal boron nitride optical nano dipole antennae
Photo Physics
Overcome charge-up effects in SEMs
during non-conductive specimen observation with Hitachi’s UVD
Linear Sliding Tribometer
with Inline 3D Imaging