High quality materials research investigates the relationships between the synthesis, processing, structure, properties, and performance of materials that enable an engineering function. It involves relating the desired properties and performance of a specific material in a certain application to the structure of the atoms and phases in that material through characterization. At ST Instruments we provide a complementary range of surface measurement equipment to accelerate your research in this field.
Electrical Conductivity Measurement of Carbon Nanotubes Film
Conductive Probe Atomic Force Microscopy
Silanized Surfaces
Imaging Ellipsometry
Optimum Current Distribution Measurement of Zinc Oxide Nanorods
Materials Science: PinPoint™ Conductive AFM
Localization, Characterization and Quality Control of Graphene and 2D Materials
Imaging Ellipsometry
Segregation of impurities in ductile iron
Scanning Auger spectroscopy combined with in-situ facture analysis