High quality materials research investigates the relationships between the synthesis, processing, structure, properties, and performance of materials that enable an engineering function. It involves relating the desired properties and performance of a specific material in a certain application to the structure of the atoms and phases in that material through characterization. At ST Instruments we provide a complementary range of surface measurement equipment to accelerate your research in this field.
Linear Sliding Tribometer
with Inline 3D Imaging
Overcome charge-up effects in SEMs
during non-conductive specimen observation with Hitachi’s UVD
Low Friction Measurements
with Nano Tribometer Module
Reducing friction and wear loss of materials by lubrication technologies
4-Ball Wear Tester
High Temperature Hardness Testing on alloys
using MFT5000
Hexagonal boron nitride optical nano dipole antennae
Photo Physics
Electrical Conductivity Measurement of Carbon Nanotubes Film
Conductive Probe Atomic Force Microscopy
Segregation of impurities in ductile iron
Scanning Auger spectroscopy combined with in-situ facture analysis
2D materials morphology and electrical property testing
using high vacuum conducting SPM
The tribological study of a surface of an archaeological drawing
The tribological study of a surface of an archaeological drawingusing a S-NEOX Optical Profiler
Silanized Surfaces
Imaging Ellipsometry
Localization, Characterization and Quality Control of Graphene and 2D Materials
Imaging Ellipsometry
Optimum Current Distribution Measurement of Zinc Oxide Nanorods
Materials Science: PinPoint™ Conductive AFM