PinPoint Piezoelectric Force Microscopy

PinPoint Piezoelectric Force Microscopy

Characterization of annealed phenanthrenethin film on top of an ITO surface

In this application note, piezoelectric force microscopy is performed utilizing the newly-developed PinPoint™ mode by Park Systems as opposed to the conventional contact mode. Performance comparison of PinPoint™ PFM and conventional PFM was carried out on annealed phenanthrene film, and improved resolution was observed in both topography and piezoelectric response signal with PinPoint™ PFM.