07 feb Newly designed FlexSEM1000 II Scanning Electron Microscope
Krefeld | February 7, 2019
The new Hitachi High-Technologies Corporation FlexSEM1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.
High performance in a compact system for various methods of observations.
With the highest in-class resolution of 4nm, the FlexSEM1000 II offers user-friendly operation and sophisticated automatic functions for a wide range of users, from beginners to experts.
Non-conductive specimen observation
Observation of non-conductive specimens is available by using the VP mode with charge artifact reduction. High-contrast images are obtained due to improved sensitivity of the backscattered electrons. Hitachi’s ultra-variable pressure detector (UVD) generates a secondary electron-type image by detecting visible light excited by the electron-gas interaction. Charge artifacts can occur in high vacuum causing image distortion, such as image drift, extreme contrast changes, and other false information. However, by controlling the electrostatic charge on the specimen using VP mode, a clear observation of the specimen’s surface structure is possible.
Wide area observation by Multi Zigzag
Multi Zigzag (sequential field-of-view image capturing) is a function that generates a low-magnification image out of multiple high-magnification images taken with different fields of views. This enables wide-area observation with low-magnification/high-resolution images that are difficult to capture manually by using a SEM. In addition to the conventional Zigzag functions, multiple areas over multiple specimens can be defined in Multi Zigzag.