PHI nanoTOF3 launches new Parallel Imaging MS/MS mass spectrometer - ST Instruments
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PHI nanoTOF3 launches new Parallel Imaging MS/MS mass spectrometer

PHI nanoTOF3 launches new Parallel Imaging MS/MS mass spectrometer

Groot-Ammers  | October 28, 2021

We are excited to announce the 7th Generation of TOF-SIMS from Physical Electronics.

  • NEW sleek appearance, ergonomic design, reduced footprint, and reduced power consumption
  • NEW fully automated stage design with in-vacuum parking for reliable, high-throughput sample handling
  • NEW bismuth LMIG cluster ion emitter with improved spatial resolution

 

Reliable automation and remote operation

  • Highly configurable queuing system for automated unattended analysis and maximum efficiency
  • Fully remote operation and advanced remote diagnostics

 

Patented Turn-Key Dual-Beam Charge Neutralization

  • NEW combination of pulsed low-energy electrons and low-energy Ar+ ions for robust and truly turn-key insulator analysis in both +ve and -ve ion polarities

 

Patented Parallel Imaging MS/MS Spectrometer

  • Flat and rough samples alike are easily analyzed by the 7th generation of PH l’s triple-focus mass analyzer
  • Parallel Imaging MS/MS takes TOF-SIMS peak identification from “I think” to “I know!”
  • Lossless and high sensitivity tandem MS analysis of peaks down to < 20 ppm abundance

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