04 Feb The release of the 5th generation of Sensofar’s optical profiler S-NEOX
Terrassa | January 30, 2019
Sensofar Metrology has announced the 5th generation of Sensofar’s optical profiler. The new S neox outperforms existing optical 3D profiling microscopes in terms of design, functionality, efficiency and performance.
The most impressive feature to highlight is the speed. Everything is faster with new smart and unique algorithms. Standard measurement acquisition is 5X faster than before, making the S neox the fastest areal measurement system in the market.
The most significant features are:
- New Active illumination Focus Variation is an optical technology that has been developed for measuring the shape of large rough surfaces. It has been improved with the use of active illumination to get more reliable focus location even on optically smooth surfaces.
- New thin film measurement technique which allows the user to measure the thickness of optically transparent layers quickly, accurately, non-destructively and with no sample preparation. Transparent films from 50 nm to 1.5 μm can be measured in less than 1 second.
- Differential Interference Contrast (DIC) has been added to emphasize very small height features which have no contrast in regular observation.
- High Dynamic Range (HDR) mitigates reflection and drop-out points on highly reflective surfaces (local slopes and/or different materials).
For more information, download the leaflet.