Thickness Measurements

Thickness Measurements

Thickness measurements are used to determine film thickness and refractive index of polymers, semiconductors, thin film metals and many more. This widespread use is explained by increased dependence on thin films in many areas and the flexibility to measure most material types.

Single-Spot Thickness Measurements
Tabletop systems for measuring film thickness and refractive index

 

♦   F20 / General-purpose film thickness measurement
   instruments
♦   F10-Arc / Anti-Reflection Coating Measurements
♦   F10-HC / Measure Thickness of Single- and Multi-
   Layer Hardcoat
♦   F10-AR / Anti-Reflection Coating Measurements
♦   F10-RT / Measure Reflectance and Transmittance
♦   F3-CS
/ Measure Small Witness or Coupon Samples
♦   F3-sX / Spectral Reflectometers for Measuring Very
   Thick Layers

Microscopic-Spot Thickness Measurements
Used when a measurement spot as small as 1 µm is required


♦   F40
/ Microscope-based Film Thickness
♦   Measurements

Automated Mapping Systems
Fully-automatic mapping of thickness and index for nearly any sample shape

♦   F60-t / Automated Thin Film Thickness Mapper
♦   F54-XY-200 / Automated Thin Film Thickness Mapper
♦   F54 / Automated Thin Film Thickness Mapper
♦   F50 / Thin Film Thickness Mapper

Inline Thickness Monitoring
Monitor and control thickness of moving films during production

♦   F32 / Compact Solution for In-line measurements
♦   F30 / Most Powerfull Toll for Monotoring Thin-Film
   Deposition