F3-sX

F3-sX

The F3-sX family measures semiconductor and dielectric layers up to 3 mm thick. Such thick layers tend to be rougher and less uniform than thinner layers, which the F3-sX counters with a 10-µm-diameter measurement spot. With it the F3-sX family easily measures materials that are impossible to measure with other instruments.

ICON-key-features-greyKey Features and Benefits

♦   10µm spot size

♦   Easiness of use

♦   Up to 3mm thick layers 

ICON-key-features-greyRelated Applications

♦   Si wafer thickness

♦   IC failure analysis

♦   Thick photoresist

About Filmetrics

Since 1995, Filmetrics has been providing thin-film measurement solutions that are both simple and affordable. The Filmetrics approach results in film-thickness measurements that takes less than a second, by operators who can be trained in minutes.

Why Filmetrics?

♦   Easy-to-use and cost efficient systems

♦   Solutions for any thin-film measurement

♦   Very fast measurements

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