Imaging Ellipsometer

Imaging Ellipsometry is a non-destructive optical method for determining film thickness and optical properties. This combination of nulling ellipsometry and microscopy enables you to obtain a real time ellipsometric contrast image with a lateral resolution of 1 micron. As a result, you receive high contrast images from the surface with the highest resolution.

Imaging Ellipsometer


ICON-key-features-greyKey Features and Benefits

♦   Lateral resolution of 1 micron

♦   Visualization with ellipsometric contrast image

♦   Wavelength range 250nm – 1700nm

ICON-key-features-greyApplications

♦   ITO films

♦   Graphene and 2D materials

♦   Microstructured lipid bilayers

About Accurion

Accurion provides high-end and reliable state-of-the-art technology in two product lines: Imaging Ellipsometry and Active Vibration Isolation. Nanofilm has been the leader in Brewster Angle Microscopy and Imaging Ellipsometry since 1991. Halcyonics was founded in 1996 as specialist in Active Vibration Isolation. The existing product brands Nanofilm and Halcyonics are continued as product divisions of Accurion.

Why Accurion?

♦   Leading in Imaging Ellipsometry and BAM

♦   Solutions for any thin-film measurement

♦   Large range of active vibration isolation solutions

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