The F30 measures deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the F30 spectral reflectance system.
♦ Monitoring Thin-Film Deposition
♦ Fast measurements
♦ Absorbing Films
♦ MBE and MOCVD
Since 1995, Filmetrics has been providing thin-film measurement solutions that are both simple and affordable. The Filmetrics approach results in film-thickness measurements that takes less than a second, by operators who can be trained in minutes.
♦ Easy-to-use and cost efficient systems
♦ Solutions for any thin-film measurement
♦ Very fast measurements