The F30 measures deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the F30 spectral reflectance system.

ICON-key-features-greyKey Features and Benefits

♦   Monitoring Thin-Film Deposition

♦  Fast measurements

♦   Non-invasive


♦   Semiconductor

♦   Absorbing Films

♦   MBE and MOCVD

About Filmetrics

Since 1995, Filmetrics has been providing thin-film measurement solutions that are both simple and affordable. The Filmetrics approach results in film-thickness measurements that takes less than a second, by operators who can be trained in minutes.

Why Filmetrics?

♦   Easy-to-use and cost efficient systems

♦   Solutions for any thin-film measurement

♦   Very fast measurements

Product icon oranjeRelated products

Optical Profilometer S neox

S neox

Non-invasive measurement of micro-and nanogeometries with multiple optical technologies

Profilm 3D

Cost-effective optical profilometer for roughness measurements

Minilab Platforms

Superior coating performance and flexible configurations