Film thickness is measured in-line quickly and easily with the affordable F32. Spectral analysis of reflectance from the top and bottom of your film provides thickness information in real time. The F32 advanced-spectrometry system comes in a half-width 3U rack-mount chassis and, with additional spectrometers, can measure up to four different locations

ICON-key-features-greyKey Features and Benefits

♦   Compact Solution for In-Line Measurements

♦   Total Film thickness

♦   Process control through digital I/O


♦   Semiconductor

♦   Polymer Films

♦   Solar

About Filmetrics

Since 1995, Filmetrics has been providing thin-film measurement solutions that are both simple and affordable. The Filmetrics approach results in film-thickness measurements that takes less than a second, by operators who can be trained in minutes.

Why Filmetrics?

♦   Easy-to-use and cost efficient systems

♦   Solutions for any thin-film measurement

♦   Very fast measurements

Product icon oranjeRelated products

Optical Profilometer S neox

S neox

Non-invasive measurement of micro-and nanogeometries with multiple optical technologies

Profilm 3D

Cost-effective optical profilometer for roughness measurements

Minilab Platforms

Superior coating performance and flexible configurations