Thin-film thickness on samples up to 200mm by 200mm is easily mapped with the F54-XY-200 advanced spectral reflectance system. The motorized X-Y stage moves automatically to specified measurement locations, facilitating thickness measurements as quickly as two points per second.
Key Features and Benefits
♦ Automated Film Thickness Mapping
♦ Fast measurements
♦ 200×200 mm mapping
Applications
♦ Semiconductor
♦ LCD
♦ Optical coatings
About Filmetrics
Since 1995, Filmetrics has been providing thin-film measurement solutions that are both simple and affordable. The Filmetrics approach results in film-thickness measurements that takes less than a second, by operators who can be trained in minutes.
Why Filmetrics?
♦ Easy-to-use and cost efficient systems
♦ Solutions for any thin-film measurement
♦ Very fast measurements
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