F54
Thin-film thickness of samples up to 450 mm in diameter are mapped quickly and easily with the F54 advanced spectral reflectance system. The motorized r-theta stage moves automatically to selected measurement points and provides thickness measurements as fast as two points per second.
Key Features and Benefits
♦ Automated Film Thickness Mapping
♦ Fast measurements
♦ Up to 450 mm mapping
Applications
♦ Semiconductor
♦ LCD
♦ Optical coatings
About Filmetrics
Since 1995, Filmetrics has been providing thin-film measurement solutions that are both simple and affordable. The Filmetrics approach results in film-thickness measurements that takes less than a second, by operators who can be trained in minutes.
Why Filmetrics?
♦ Easy-to-use and cost efficient systems
♦ Solutions for any thin-film measurement
♦ Very fast measurements
Related products
Leading nano metrology tool for failure analysis and large sample research
Cost-effective optical profilometer for roughness measurements
Superior coating performance and flexible configurations