WEBINAR | Kelvin Probe Force Microscopy to Study Energy Levels and Charge Transport in Semiconductor Thin Films

Groot-Ammers | September 27th, 2021

Semiconductor thin films with engineered electrical and mechanical properties are at the very heart of emerging applications in different areas such as flexible electronics, optoelectronics or bioelectronic sensors. Research in material deposition and processing is providing an ever-increasing arsenal of techniques enabling finetuning of basic semiconductor properties.

📆 Wednesday, October 6th, 2021

🕔 11:00 – 12:30 (CET)

In order to assist these efforts, nanoscale characterization techniques are needed that reveal morphology and provide at the same time access to local electromechanical characterization, providing means to verify efficiency and homogeneity of treatments.

In this seminar Ass. Prof. Tobias Cramer, Department of Physics and Astronomy, University of Bologna will present two examples from his group’s work that illustrate Kelvin-Probe Force Microscopy in the characterization of novel semiconducting thin films. In a first example he will introduce the investigation of molecular surface treatments to shift halide perovskite workfunctions over an interval exceeding 1.0 eV.(1) Such an unprecedented control on energy levels has significant impact on perovskite solar cell and detector research. The second example introduces to the characterization of local transport properties in printed organic semiconducting microcrystals.(2, 3) Here, KPFM enables to resolve the evolution of nanoscale fracture lines caused by surface strain during bending. With KPFM one can characterize the barrier height for transport across such fractures and rationalize their impact on device deterioration in flexible electronics applications.

The theoretical introduction to KPFM will be presented by Ilka Hermes, Principle Scientist at Park Systems Europe.

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