WEBINAR | Make the most out of your tip: the benefits of True Non-contact mode imaging

WEBINAR | Make the most out of your tip: the benefits of True Non-contact mode imaging

Groot-Ammers | May 3rd, 2021

For topographical imaging most Atomic Force Microscopes (AFMs) rely on intermittent or tapping mode. This technique oscillates the AFM probe at a driving frequency close to its resonance frequency with amplitudes in the tens or hundreds of nanometers. At each pixel the tip comes into intermittent contact with the sample and the change in amplitude provides the height signal.

DATE & TIME
📆 Wednesday, May 5th, 2021

🕔 11:00 – 12:30 (CET)

The downside of tapping mode is the actual contact between sample and tip as this will lead to tip wear or even sample damage of soft material during the scan. This does not only reduce the lifetime of the tip and thus, the cost of ownership of the AFM, but can also decrease image quality due to changes of tip shape.

This issue is tackled by the True Non-Contact Mode (NCM) on the Park Systems’ tools. Here, the tip is oscillated at lower amplitudes and not brought into contact with the sample by working only in the attractive regime of the Lennard-Jones-Potential.

During this live webinar Park systems’ presents on how to setup Tapping Mode and NCM on our tool and how to differentiate between those modes during a live scan. Furthermore, they will show results that emphasize the benefit of NCM compared to Tapping Mode.

The webinar will be presented by Dr. Florian Stumpf, Application Manager at Park Systems Europe, Mannheim, Germany

Keep me updated!

Just enter your name and email and don't miss out on all innovative technologies in the world of surface analysis.