18 Feb WEBINAR | Piezoresponsive polymers for electronic and sensor applications: a glance at a nanoscale (via Pinpoint PFM)
Groot-Ammers | February 25th, 2021
With the integration of piezoelectric polymers in sensors and electronic devices, such as transducers, an accurate structural and electromechanical characterization down to the nanoscale becomes vital.
DATE & TIME
📆 Thursday, March 4th, 2021
🕔 11:00 – 12:30 (CET)
As real-space, high resolution imaging technique, atomic force microscopy (AFM) accesses not only morphological sample information, but also resolves functional properties including nanomechanics, piezo-/ferroelectricity and electrical potential.
Therefore, AFM is ideally suited for a holistic investigation of functional polymer samples with a nanometer resolution. Here, we demonstrate the capabilities of Park Systems’ research AFMs to image the piezoelectric and nanomechanical properties of PVDF fibers simultaneously via Pinpoint piezoelectric force microscopy (PFM). PinPoint PFM prevents tip or sample damage via the elimination of shear forces and reduces topography crosstalk due to well defined tip-sample contact.
The webinar will include a live measurement on our small sample NX10 research AFM.
The webinar will be presented by Ilka Hermes, Principle Scientist at Park Systems Europe.