2D materials morphology and electrical property testing 

using high vacuum conducting SPM

The characterization and exploration of electrical and mechanical properties of 2D material are one of the most critical points in materials research field. Researchers from IMEC and University of Leuven obtained topographical, electrical and mechanical information on MoS2 using atomic force microscopy. During their studies both ambient and high vacuum conditions are compared which clearly demonstrated better sensitivity under high vacuum conditions.

For more information, download the application note.