♦ Nano Series | Compact high-performance isolators for small to mid-size applications
♦ i4 Series | High-performance isolators for small to mid-size applications
♦ Vario Series | Modular active isolation elements for flexible use and a variety of loads
♦ Workstation Series | Ergonomic laboratory tables with integrated active isolation system
♦ Heavy Load Isolation Solutions | Vibration isolation of heavy equipment weighing more than 600kg
To control vibration in all six degrees of freedom the system uses several active elements and a feedback mechanism. The active elements consist of a piezoelectric accelerometer, an analog output control, an electromagnetic transducer and a spring. The spring holds the weight of device on top of the active vibration isolation platform and helps isolating frequencies above 200 Hz. For lower frequencies the active part with feedback controls the isolation of the instrument on top. In this case the very sensitive piezoelectric accelerometer detects the external vibrations to the instrument which are fed back to the electromagnetic force transducer for compensation of the measured vibration levels at specific frequencies.
Active vibration isolation is very important in today’s world of nanotechnology. It is essential for creating and analyzing very small structures. Our platforms manufactured by Accurion (Halcyonics) for active vibration isolation cancel out incoming vibrations to prevent the transfer of vibrations to any sensitive measurement system. This form of vibration isolation is undoubtedly the most effective solution to isolate high-resolution measurement instruments from disturbing vibrations. We offer a broad range of products for active vibration isolation.
There are many technologies and products with could benefit from the active vibration isolation solution we provide. Many of these systems are vibration sensitive equipment. Potential instrumentation to consider would be; Brewster Angle Microscopy, Confocal Microscopy, Digital Holography, Ellipsometry, Fluorescence Microscopy, Inverted Microscopy, Langmuir-Blodgett trough, Laser Scanning Microscopy, Nanoindentation, Optical 3D Measurement, Patch clamping, Profilometry, Raman Microscopy, Scanning Electron Microscopy – SEM, Scanning Probe Microscopy – SPM, Spectrometry and Tensiometers.