♦ nanoTOF 3 TOF-SIMS | patented TRIFT mass spectrometer with superior sensitivity
♦ 710 Scanning Auger Nanoprobe | High spatial resolution Auger imaging performance for the most demanding AES applications
Surface analysis techniques like XPS (X-ray Photoelectron Spectroscopy), TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry), and AES (Auger Electron Spectroscopy) are essential tools for investigating the composition and chemistry of materials at the atomic and molecular level. Each technique offers unique capabilities for characterizing surfaces, interfaces, and thin films:
In summary, XPS, TOF-SIMS, and AES are powerful surface analysis techniques that provide complementary information about the composition and chemistry of materials at the atomic and molecular scale. Researchers choose these techniques based on their specific analytical needs, the depth of information required, and the type of material being studied. These techniques play a crucial role in advancing fields such as materials science, nanotechnology, electronics, and biomedicine by enabling precise characterization of surfaces and interfaces.