Surface Analysis


A surface is the outermost layer of any physical object. It is the portion of the object that can be perceived by an observer using their sense of sight and touch and is the portion with which surrounding materials first interact. The outermost part of a material is an extremely important component responsible for interfacial characteristics such as chemical reactivity, adhesion, wetness, electrical properties, optical properties, corrosion-resistance, friction, and biocompatibility of the material.

XPS

ELEMENTAL & CHEMICAL STATE INFORMATION

♦   Quantes | Combines conventional XPS with HAXPES for extended depth of analysis

♦   VersaProbe 4 XPS Scanning Microprobe | Multi-technique XPS including PHI’s patented X-ray beam induced secondary electron imaging.

♦   Quantera II XPS Scanning Microprobe | High throughput automated XPS with the highest small area sensitivity

TOF-SIMS

ELEMENTAL, CHEMICAL & MOLECULAR STATE INFORMATION

♦   nanoTOF 3 TOF-SIMS | patented TRIFT mass spectrometer with superior sensitivity

Auger

ELEMENTAL STATE INFORMATION

♦  710 Scanning Auger Nanoprobe | High spatial resolution Auger imaging performance for the most demanding AES applications