Chemical Analysis

Our chemical analysis instruments provide detailed chemical characterization reaching from atomic layers down to microns. These measurements provide a means to correlate performance with surfaces or thin film composition.

Surface Analysis

ELEMENTAL, CHEMICAL & MOLECULAR STATE INFORMATION

♦ XPS | Elemental & Chemical State Information

♦ TOF-SIMS | Elemental, Chemical & Molecular State Information

♦ Auger | Elemental State Information

Raman Spectroscopy

NON-DESTRUCTIVE MICROSCOPIC CHEMICAL ANALYSIS

♦ high stability and reliability

♦ high performance and speed

♦ time saving automation

IR Spectroscopy

AFM-IR & SUBMICRON IR

♦ Vista-IR | Combines AFM with IR spectroscopy

♦ mIRage | Submicron IR spectroscopy and imaging

Fluorescence Spectroscopy

FLUORESCENT SPECTROSCOPY

♦ Modular Research Fluorometer

♦ Fluorescence and Absorbance Spectrometer

Elemental Analysis

ELEMENTAL ANALYSIS

♦ ICP-OES Spectrometers

♦ RF Glow Discharge Spectrometers

♦ Carbon/ Sulfur Analyzers

♦ Oxygen/ Nitrogen/ Hydrogen Analyzers

♦ X-ray Fluorescence Analyzers

♦ Sulfur-in-Oil Analyzers