ST Instruments has the pleasure to invite you for the webinar 'Helpful Hints and Guidance for TOF-SIMS Data Reduction & Interpretation' presented by Gregory L. Fisher, PhD. Principal Scientist at Physical Electronics.DATE & TIME
📆 Thursday, 22nd of July🕔 17:00 (CET)
Noval high-tech materials share a common denominator: a careful design in the nanometer range. From functional polymer composites to wearable electronics or 2D materials, local variations in mechanical properties dictate the macroscopic properties. Here, atomic force microscopy offers more analytic insights beyond mere topography.DATE & TIME
📆 Wednesday, July 14th, 2021🕔 11:00 - 12:30 (CET)
See first-hand, with a live online instrument demo, how the new breakthrough technique of Optical Photothermal IR (O-PTIR) spectroscopy is revolutionizing the field of IR spectroscopy.
Furthermore, see how it is also allowing for the combination with Raman, to provide for submicron simultaneous IR+Raman microscopy – a world first and only. DATE & TIME
📆 Thursday, July 15th, 2021🕔 11:00 - 12:00 (CET)
Fraunhofer IMWS and Park Systems will organise the International SPM Symposium on Failure Analysis and Material Testing - FAMT 2021 on Thursday, July 1st, 2021Advancing miniaturization shapes our modern high-tech world. The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.