03 Nov WEBINAR | An Inside Look at the Capabilities, Workflows, and Unique Features of the PHI Genesis XPS Platform
Posted at 09:52h
in News
Groot-Ammers | November 3rd, 2026
Advanced materials research requires surface analysis tools that provide high-quality surface and interface information while remaining easy to use. The PHI Genesis platform was designed to meet this need by combining high-performance XPS with a flexible, multi-technique analytical approach.
DATE & TIME
📆 Thursday, December 3rd, 2026
🕔 17:00 (CET)

