Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will commence sales of the SU3800 and the oversized SU3900 scanning electron microscopes (SEMs) featuring the ability to accommodate large, heavy specimens, along with advanced functionalities for automated measurement and wide-angle camera navigation.
The new Hitachi High-Technologies Corporation FlexSEM1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.
Sensofar Metrology has announced the 5th generation of Sensofar’s optical profiler. The new S neox outperforms existing optical 3D profiling microscopes in terms of design, functionality, efficiency and performance. The most impressive feature to highlight is the speed. Everything is faster with new smart and unique algorithms. Standard measurement acquisition is 5X faster than before, making the S neox the fastest areal measurement system in the market.