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Santa Barbara | September 19, 2016
Anasys Instruments, the world leader in nanoscale IR spectroscopy, announces its next generation nanoscale IR spectroscopy and chemical imaging system, the nanoIR2-FS.
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International Conference on Crystal Growth and Epitaxy | August 7-12, 2016
At the 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18) in Nagoya, Japan (7-12 August), analytical and imaging instrument maker Nanophoton Corp of Osaka, Japan has introduced the RAMANdrive wafer analyzer for a wide range of applications in the semiconductor market.
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Santa Clara | August 3, 2016
Park Systems, world leading manufacturer of Atomic Force Microscopes (AFM) today announced Park NX20 300mm, the first and only research AFM on the market capable of scanning the entire sample area of 300 mm wafers using a 300 mm vacuum chuck while keeping the system noise level below 0.5 angstrom (Å) RMS.
Geplaatst op 14:56h
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Moorfield are pleased to announce the latest model in their nanoCVD range, model nanoCVD-WPG. The nanoCVD-WPG is a wafer-scale, plasma-enhanced CVD system for graphene synthesis.
