12 aug Nanophoton launches Raman wafer analyzer for wafer diameters up to 300mm

International Conference on Crystal Growth and Epitaxy | August 7-12, 2016
RAMAN-wafer-analyzer-At the 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18) in Nagoya, Japan (7-12 August), analytical and imaging instrument maker Nanophoton Corp of Osaka, Japan has introduced the RAMANdrive wafer analyzer for a wide range of applications in the semiconductor market.
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NX20 300mm

03 aug Park Systems Launches Park NX20 300mm Research Atomic Force Microscope with Full 300 mm Semiconductor Wafer Scan

Santa Clara |  August 3, 2016
Park-NX20-300mm-Park Systems, world leading manufacturer of Atomic Force Microscopes (AFM) today announced Park NX20 300mm, the first and only research AFM on the market capable of scanning the entire sample area of 300 mm wafers using a 300 mm vacuum chuck while keeping the system noise level below 0.5 angstrom (Å) RMS.
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