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Chanhassen | November 2, 2016
PHI has developed the first commercial TOF-SIMS tandem mass spectrometry instrument (MS/MS). This provides for unambiguous peak identification and parallel MS/MS imaging capability.
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Free Magazine | October 28 2016
The newest NANOscientific includes:
- Current Trends in Spintronics and NanoStructured Materials
- How Highly Efficient Perovskite Solar Cells are Visualized Using AFM
- Accelerating Yield Improvement by Finding & Eliminating Defects is the Key to Acieving "More Moore's" and "More than Moore"
- Electrical Characterization of Semiconductor Device Using SCM and SKPM Imaging
- Hair Damage From Sunlight Radiation Observed Using AFM
- Glimses of the Nanoscale / Showcasing AFM Images
- Topography, Phase Imaging, and Nanomechanical Property Investigation of Polyester Yarn Interaction with Silicon Matrix
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Santa Barbara | September 19, 2016
Anasys Instruments, the world leader in nanoscale IR spectroscopy, announces its next generation nanoscale IR spectroscopy and chemical imaging system, the nanoIR2-FS.
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International Conference on Crystal Growth and Epitaxy | August 7-12, 2016
At the 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18) in Nagoya, Japan (7-12 August), analytical and imaging instrument maker Nanophoton Corp of Osaka, Japan has introduced the RAMANdrive wafer analyzer for a wide range of applications in the semiconductor market.
