08 Apr Hitachi High-Technologies launces the SU3800 and SU3900 Scanning Electron Microscopes
Posted at 14:11h
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04 Apr Eurofinish + Materials 2019
Posted at 13:49h
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Groot-Ammers | April 4, 2019
On Wednesday 15 and Thursday 16 May we are participating EUROFINISH+MATERIALS 2019, the meeting place with all aspects for a good and sustainable product.
07 Feb Newly designed FlexSEM1000 II Scanning Electron Microscope
Posted at 12:55h
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Krefeld | February 7, 2019
The new Hitachi High-Technologies Corporation FlexSEM1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.
04 Feb The release of the 5th generation of Sensofar’s optical profiler S-NEOX
Posted at 15:08h
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Terrassa | January 30, 2019
Sensofar Metrology has announced the 5th generation of Sensofar’s optical profiler. The new S neox outperforms existing optical 3D profiling microscopes in terms of design, functionality, efficiency and performance.
The most impressive feature to highlight is the speed. Everything is faster with new smart and unique algorithms. Standard measurement acquisition is 5X faster than before, making the S neox the fastest areal measurement system in the market.