28 okt NANOscientific Magazine 2016, Fall

Free Magazine  | October 28 2016

The newest NANOscientific includes:
NANOscientific magazine, Fall 2016 - Current Trends in Spintronics and NanoStructured Materials - How Highly Efficient Perovskite Solar Cells are Visualized Using AFM - Accelerating Yield Improvement by Finding & Eliminating Defects is the Key to Acieving "More Moore's" and "More than Moore" - Electrical Characterization of Semiconductor Device Using SCM and SKPM Imaging - Hair Damage From Sunlight Radiation Observed Using AFM - Glimses of the Nanoscale / Showcasing AFM Images - Topography, Phase Imaging, and Nanomechanical Property Investigation of Polyester Yarn Interaction with Silicon Matrix
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12 aug Nanophoton launches Raman wafer analyzer for wafer diameters up to 300mm

International Conference on Crystal Growth and Epitaxy | August 7-12, 2016
RAMAN-wafer-analyzer-At the 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18) in Nagoya, Japan (7-12 August), analytical and imaging instrument maker Nanophoton Corp of Osaka, Japan has introduced the RAMANdrive wafer analyzer for a wide range of applications in the semiconductor market.
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