The new Hitachi High-Technologies Corporation FlexSEM1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.
Sensofar Metrology has announced the 5th generation of Sensofar’s optical profiler. The new S neox outperforms existing optical 3D profiling microscopes in terms of design, functionality, efficiency and performance. The most impressive feature to highlight is the speed. Everything is faster with new smart and unique algorithms. Standard measurement acquisition is 5X faster than before, making the S neox the fastest areal measurement system in the market.
The winter edition of NANOscientific Magazine is available. NANOscientific includes the latest advancements in the field of Nanoscience and technology across a wide range of multidisciplinary areas of research. This edition includes: