Molecular Vista Inc. launches the next generation AFM-IR instrument: Vista 75

Groot-Ammers  | December 19th, 2022

We are excited to announce the next generation AFM-IR instrument, combining AFM with IR (AFM-IR) spectroscopy to provide IR spectral imaging with unprecedented sub-5 nm spatial resolution.

Building on the patented photo-induced force microscopy (PiFM) technology of the Vista One, the Vista 75 is the latest instrument from Molecular Vista’s proven AFM-IR line-up. Reliable and repeatable measurements in the sub 5-nm region provide a nano-FTIR spectrum in less than a second, comparable to regular FTIR spectra in your usual FTIR database, now on even larger samples, in a more compact design.


Keep me updated!

Just enter your name and email and don't miss out on all innovative technologies in the world of surface analysis.