Atomic force microscopy (AFM) and its associated functional modes such as Kelvin probe force microscopy (KPFM) detect forces on the scale of 1 nN in-order-to measure the topography and functional properties of surfaces with nanometre scale resolution. DATE & TIME
📆 Wednesday, May 18th, 2022🕔 11:00 - 12:00 (CET)
Please join Prof Håvard J. Haugen to hear about how cutting edge analytical tools, including the breakthrough technique of Optical Photothermal Infrared (O-PTIR) spectroscopy is being used to characterise the biochemical structure of bone tissue and the bone-biomaterial interface in a new generation of biomimetic bone graft, where intrinsic disordered peptides are embedded into a degradable polymer resulting in improved bone formation and biomineralization.DATE & TIME
📆 Thursday, May 5th, 2022🕔 11:00 - 12:00 (CET)
ST Instruments has the pleasure to invite you for the webinar 'Hints and Methods for Use of Tandem MS in TOF-SIMS Data Reduction, Interpretation and Peak Identification' presented by Greg Fisher Ph.D., Principal Scientist at Physical Electronics.DATE & TIME
📆 Thursday, April 21st, 2022🕔 17:00 (CET)
Atomic Force Microscopy is a powerful analytical technique for characterizing materials as it provides profound insight into the innate material properties. The lately introduced Park FX40 Automatic AFM has now made it possible for anyone to perform those measurements with ease. Through its unique automation and machine learning, Park FX40 can change samples and probes with just one click. This makes the tool suitable for remote handling from anywhere in the world through internet. DATE & TIME
📆 Wednesday, March 30th, 2022🕔 11:00 - 12:00 (CET)
Please join Dr. Ferenc Borondics to hear about how cutting edge IR spectroscopic tools, such as the breakthrough technique of Optical Photothermal Infrared (O-PTIR) is being used by users from a wide range of application areas, many of these based on recent publications in high impact factor journals.DATE & TIME
📆 Thursday, March 10, 2022🕔 11:00 - 12:00 (CET)
Atomic force microscopy (AFM) and its associated functional modes such as Kelvin probe force microscopy (KPFM) detect forces on the scale of 1 nN in-order-to measure the topography and functional properties of surfaces with nanometre scale resolution.
DATE & TIME
📆 Wednesday, May 18th, 2022
🕔 11:00 - 12:00 (CET)
